US Patent Issued to ANRITSU on March 31 for "X-ray inspection apparatus and x-ray inspection system" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,910, issued on March 31, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"X-ray inspection apparatus and x-ray inspection system" was invented by Itaru Miyazaki (Kanagawa, Japan) and Eiji Tsujimura (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance ...