ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,907, issued on March 31, was assigned to ANRITSU Corp. (Atsugi, Japan).
"X-ray inspection apparatus" was invented by Takeshi Yamazaki (Atsugi, Japan) and Takashi Kanai (Atsugi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes: a transportation unit that transports an object through an inspection area; an X-ray generation source; an X-ray detection unit; an image data generation unit that generates image data from an output of the X-ray detection unit; a good or not determination unit that performs quality inspection of the object based on the generated image data and a predetermined criterion; and a contro...