US Patent Issued to ANRITSU on July 14 for "Optical pulse test device and optical pulse test method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,908, issued on July 14, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Optical pulse test device and optical pulse test method" was invented by Ryota Takasu (Kanagawa, Japan), Taichi Murakami (Kanagawa, Japan) and Kodai Ishida (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to the present disclosure, an optical pulse test device includes an OTDR waveform measurement unit that measures an OTDR waveform with a plurality of pulse widths, an event analysis unit that calculates a level, a loss, and a return loss at a start point of each event, and an analysis result integration unit that calculates a cumulative loss at the st...