US Patent Issued to ANRITSU on July 14 for "Mobile terminal test system and mobile terminal test method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,684,375, issued on July 14, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Mobile terminal test system and mobile terminal test method" was invented by Seiya Kato (Kanagawa, Japan) and Ryota Chinbe (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a mobile terminal test system and a mobile terminal test method capable of greatly reducing a time required to a setting of a parameter for a plurality of test cases. A common parameter extraction unit that extracts parameters of the same type among a plurality of parameters included in a plurality of test cases selected by an operation unit as a plurality of common parameter...