US Patent Issued to ANOR TECHNOLOGIES on Sept. 1 for "Terahertz spectroscopy system with specialized measurement unit for non-destructive sample detection" (Singaporean Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,085, issued on Sept. 1, was assigned to ANOR TECHNOLOGIES PTE. LTD. (Singapore).

"Terahertz spectroscopy system with specialized measurement unit for non-destructive sample detection" was invented by Nan Zhang (Singapore) and Haiwen Gu (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application discloses a measurement unit for holding a sample (including a powder sample in small quantity, a scattered powder sample or an aqueous solution sample) for a terahertz beam irradiation; and a terahertz spectroscopy system with the measurement unit for measuring an absorption signal from the sample. In particular, the terahertz beam can ...