US Patent Issued to Amazon Technologies on Jan. 20 for "Test account and test artifact management" (American, Indian Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,278, issued on Jan. 20, was assigned to Amazon Technologies Inc. (Seattle).

"Test account and test artifact management" was invented by Yuk Lun Patrick Kwan (Bellevue, Wash.), Trey Walker Porter (Seattle), Huang Li (Seattle), Chenghao Sun (Seattle), Virti Pitliya (Ratlam, India), Siva Shankaran Vasanth (Redmond, Wash.) and Gary Rittinger (Kent, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for test account management are disclosed. Data may be stored for a plurality of test accounts in at least one memory. Each test account is associated with a test account pool. Data indicative of a plurality of rules associated with the ...