US Patent Issued to Amazon Technologies on Feb. 10 for "Staged bias measurements in machine learning pipelines" (German, American Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,926, issued on Feb. 10, was assigned to Amazon Technologies Inc. (Seattle).

"Staged bias measurements in machine learning pipelines" was invented by Sanjiv Das (San Jose, Calif.), Michele Donini (Berlin), Jason Lawrence Gelman (Los Altos, Calif.), Kevin Haas (Los Gatos, Calif.), Tyler Stephen Hill (Los Altos, Calif.), Krishnaram Kenthapadi (Sunnyvale, Calif.), Pinar Altin Yilmaz (Palo Alto, Calif.), Muhammad Bilal Zafar (Berlin) and Pedro L Larroy (Redwood City, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Bias metrics may be captured at different stages for training a machine learning model. A training job may specify bias metrics to captu...