US Patent Issued to Altera on Nov. 3 for "Built-in-self-test circuits and methods in sectors of integrated circuits" (Malaysian Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,856, issued on Nov. 3, was assigned to Altera Corp. (San Jose, Calif.).

"Built-in-self-test circuits and methods in sectors of integrated circuits" was invented by Kok Wah Khor (Nibong Tebal, Malaysia).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes sectors of logic circuits. Each of the sectors of logic circuits includes a local sector manager controller circuit that provides an indication to perform a memory test. Each of the sectors also includes a built-in-self-test circuit that is configurable to generate a control signal and expected data in response to the indication to perform the memory test. Each of the sectors ...