ALEXANDRIA, Va., May 19 -- United States Patent no. 12,632,986, issued on May 19, was assigned to ALPHA NETWORKS INC. (Hsinchu, Taiwan).

"Method of measuring offset of optical axis" was invented by Wei-Yi Hung (Hsinchu, Taiwan), Chao-Hsi Wang (Hsinchu, Taiwan) and Ching-An Yang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of measuring an offset of an optical axis of an imaging system is implemented by a computing device. The imaging system captures a reference central marker and two reference outer markers on a surface to obtain a captured central marker and two captured outer markers on an image. The imaging system is rotated by a target angle such that the captured central marke...