US Patent Issued to ADVANTEST on Sept. 29 for "Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,144, issued on Sept. 29, was assigned to ADVANTEST Corp. (Tokyo).

"Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus" was invented by Daisuke Watanabe (Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing apparatus includes a driver and a test signal providing section. The driver is connected electrically to a device under test and arranged to provide a test signal to the device under test. The test signal providing section is arranged to provide the test signal to the driver. The driver is closer than the test signal providing section to the device...