ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,042, issued on Oct. 27, was assigned to ADVANTEST Corp. (Tokyo).
"Magnetically retained replaceable chuck assembly for pick-and-hold test head unit" was invented by Patrick Sherman (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present invention provide a contact chuck test head for a handler of an integrated circuit tester system. The contact chuck test head comprises a magnetically held DUT contact unit that can be replaced by a technician without requiring any tool or special equipment. The contact chuck test head t is mounted to an automated handler. Magnets are employed at an interface between the DUT contac...