US Patent Issued to Advantest on Nov. 25 for "Measurement arrangement for characterizing a radio frequency arrangement having a plurality of antennas" (German Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,483,342, issued on Nov. 25, was assigned to Advantest Corp. (Tokyo).

"Measurement arrangement for characterizing a radio frequency arrangement having a plurality of antennas" was invented by Jan Hesselbarth (Stuttgart, Germany), Jose Moreira (Stuttgart, Germany) and Serafin Fischer (Stuttgart, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An embodiment provides a measurement arrangement for characterizing a radio frequency arrangement comprising a plurality of antennas. Measurement arrangement comprises a dielectric waveguide slab with a plurality of frequency converting structures, arranged in or on the dielectric waveguide slab. Measurement a...