US Patent Issued to Advantest on May 26 for "Processor test pattern generation and application for tester systems" (California Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,501, issued on May 26, was assigned to Advantest Corp. (Tokyo).

"Processor test pattern generation and application for tester systems" was invented by Edmundo De La Puente (San Jose, Calif.), Mei-Mei Su (San Jose, Calif.) and Srdjan Malisic (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A tester system includes a test computer system for coordinating and controlling testing of a plurality of devices under test (DUTs) and a hardware interface module coupled to the test computer system and controlled by the test computer system, the hardware interface module operable to apply test input signals to the plurality of DUTs and operable to...