US Patent Issued to ADVANTEST on March 17 for "Automatic test equipment including multiple pin electronics integrated circuits in form of module" (Japanese Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,382, issued on March 17, was assigned to ADVANTEST Corp. (Tokyo).

"Automatic test equipment including multiple pin electronics integrated circuits in form of module" was invented by Hiroki Ichikawa (Tokyo), Satoshi Sudo (Tokyo) and Tasuku Fujibe (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An interface apparatus is provided between a test head and a device under test includes a frontend module configured of multiple pin electronics integrated circuits in the form of a module."

The patent was filed on July 18, 2023, under Application No. 18/354,198.

*For further information, including images, charts and tables, please visit: http://patft....