US Patent Issued to ADVANTEST on Feb. 24 for "Method, apparatus, and non-transitory computer medium for detecting defects of a device under test using time-domain reflectometry" (Japanese, Singaporean Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,640, issued on Feb. 24, was assigned to ADVANTEST Corp. (Tokyo).

"Method, apparatus, and non-transitory computer medium for detecting defects of a device under test using time-domain reflectometry" was invented by Yang Shang (Singapore), Masaichi Hashimoto (Miyagi, Japan) and Makoto Shinohara (Gunma, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method, apparatus, and/or system for soft defects modeling of measurements using time-domain reflectometry. Electro-Optic Sampling based Time-Domain Reflectometry (EOS-TDR) may quickly detect soft defects in a chip under test. For example, EOS-TDR may detect soft defects in each pin from a trace-str...