US Patent Issued to ADVANTEST on Feb. 17 for "Automatic test equipment" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,941, issued on Feb. 17, was assigned to ADVANTEST Corp. (Tokyo).

"Automatic test equipment" was invented by Hiroki Ichikawa (Tokyo) and Tasuku Fujibe (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An interface device is provided between a test head and a DUT. In the interface device, each pin electronics IC is coupled to a DUT via an FPC cable."

The patent was filed on July 18, 2023, under Application No. 18/354,255.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=12553941&O...