ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,814, issued on Feb. 10, was assigned to ADVANTEST Corp. (Tokyo).
"Control of an automated test equipment based on temperature" was invented by Jens Edelmann (Baldham, Germany) and Anton Thoma (Munich).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments according to the disclosure comprise a control device for controlling an ATE for testing a DUT which is electrically coupled to the ATE using, or for example via, a device under test (DUT) contacting structure, e.g. using or via a probe needle, or for example using or via a DUT socket. The control device is configured to figure out a temperature of the DUT contacting structure using a thermal mo...