US Patent Issued to Advanced Micro Devices on Sept. 8 for "Systems and methods for detecting ray intersections with displaced micro-meshes" (American, German Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,323, issued on Sept. 8, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"Systems and methods for detecting ray intersections with displaced micro-meshes" was invented by David Kirk McAllister (Draper, Utah), Andrew Erin Kensler (Bellevue, Wash.) and Holger Gruen (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device that defines and uses a bounding volume for testing for ray intersections with a displaced micro-mesh. The bounding volume is indirectly based on a twisted prism composed of two triangles and three bilinear patches that bounds the displaced micro-mesh. Instead of detecting intersection with the bilinear patche...