ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,721, issued on June 23, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"Binning pass with hierarchical depth data determination" was invented by Kiia K. Kallio (Inkoo, Finland), Miikka Kangasluoma (Noormakuu, Finland) and Jan Achrenius (Noormakuu, Finland).

According to the abstract* released by the U.S. Patent & Trademark Office: "Currently with performing a visibility pass for two or more coarse bins of an image, a processing system determines a bounding box for a primitive to be rendered for the image based on a bottom left-most point of the primitive and a top right-most point of the primitive. The processing system then determines whether each tile of the...