US Patent Issued to Adeia Imaging on Feb. 24 for "Capturing and processing of images including occlusions focused on an image sensor by a lens stack array" (American, German Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,563,310, issued on Feb. 24, was assigned to Adeia Imaging LLC (San Jose, Calif.).

"Capturing and processing of images including occlusions focused on an image sensor by a lens stack array" was invented by Kartik Venkataraman (San Jose, Calif.), Amandeep S. Jabbi (San Francisco), Robert H. Mullis (Santa Cruz, Calif.), Jacques Duparre (Jena, Germany) and Shane Ching-Feng Hu (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for implementing array cameras configured to perform super-resolution processing to generate higher resolution super-resolved images using a plurality of captured images and lens stack arrays that can b...