US Patent Issued to ABLIC on June 9 for "Voltage detection circuit, charge control circuit, charge and discharge control circuit, and semiconductor device" (Japanese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,914, issued on June 9, was assigned to ABLIC Inc. (Nagano, Japan).

"Voltage detection circuit, charge control circuit, charge and discharge control circuit, and semiconductor device" was invented by Shinya Fukuchi (Tokyo), Yasuhiro Miyamoto (Tokyo) and Keiichi Murakawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A voltage detection circuit, a charge control circuit, a charge and discharge control circuit, and a semiconductor device are provided. The voltage detection circuit includes: an input port; a plurality of transistors connected in series and including at least an input transistor including a gate connected to the input port, a sourc...