ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,224, issued on July 28, was assigned to Abberior Instruments GmbH (Gottingen, Germany).
"Method for localizing or tracking emitters in a sample" was invented by Roman Schmidt (Gottingen, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present specification relates to a method for localizing or tracking emitters in a sample, wherein the sample is illuminated with an intensity distribution of an illumination light comprising a local minimum, wherein light emissions of a measuring emitter induced or modulated by the illumination light are detected, and wherein a position of the measuring emitter is estimated based on the detected light emiss...