US Patent Issued to Abberior Instruments on Feb. 17 for "Method and apparatus for correcting aberrations in fluorescence microscopy" (German Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,111, issued on Feb. 17, was assigned to Abberior Instruments GmbH (Gottingen, Germany).

"Method and apparatus for correcting aberrations in fluorescence microscopy" was invented by Matthias Reuss (Goettingen, Germany), Jorn Heine (Witzenhausen, Germany) and Christian Wurm (Goettingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Scanning fluorescence microscopes and related methods are described for microscopically recording images of samples extending in three dimensions. In particular embodiments, the microscopes are configured for recording a first sectional image that is parallel to an optical axis of a microscope objective lens by sca...