ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,559, issued on May 26, was assigned to ABB Schweiz AG (Baden, Switzerland).
"Microgrid error handling framework and method" was invented by Moein Choobineh (Morrisville, N.C.), Harish Suryanarayana (Apex, N.C.), Aniket M. Joshi (Raleigh, N.C.) and Jacob T. Miscio (Raleigh, N.C.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of handling one or more errors in a microgrid includes measuring an attribute of a device within the microgrid for a measurement cycle and comparing the measured attribute of the device with a predetermined threshold attribute value. The presence of an error associated with the device is detected based on the comparison o...