US Patent Issued to 1FINITY on Aug. 25 for "Measurement method and apparatus" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,720,344, issued on Aug. 25, was assigned to 1FINITY Inc. (Kawasaki, Japan).

"Measurement method and apparatus" was invented by Qinyan Jiang (Beijing), Xin Wang (Beijing) and Meiyi Jia (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus includes a receiver configured to receive configuration information for cell reselection or measurement in connected state transmitted by a network device, the configuration information comprising first indication information indicating one or more synchronization signal blocks to be measured, wherein one or more bits of the first indication information is/are set according to second indication...