US Patent Issued on Sept. 22 for "Dynamic load pull tuner support for on-wafer testing" (Canadian Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,818, issued on Sept. 22.

"Dynamic load pull tuner support for on-wafer testing" was invented by Christos Tsironis (Kirkland, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A dynamic support platform for on-wafer mounting load pull tuners with protruding airline allows: 1) THETA compensation, 2) contact control of the wafer probe with the chip and 3) balancing the tilting of the tuner caused by moving carriages. The platform has a front segment including a central traversal rotation point, a manual height adjustment device on one end and a counter spring on the opposite end, and a back segment including a central remotely controlled height ad...