ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,115, issued on Sept. 1.
"Radar metrology system including calibration" was invented by Nick Hartmann (Kirkland, Wash.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A radar metrology system is provided for use with a movement system (e.g., a robot arm) that moves an end tool, and includes mobile and stationary radar configurations. The mobile radar configuration includes mobile radar components that are coupled to the end tool or an end tool mounting configuration. The stationary radar configuration includes stationary radar components (e.g., that surround a volume in which the end tool is moved). As part of a calibration process, the mobile radar c...