US Patent Issued on Oct. 20 for "Test and training data" (British Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,071, issued on Oct. 20.

"Test and training data" was invented by Benoit Alvarez (Oxford, Great Britain) and Bryn Horsfild-Schonhut (Wokingham, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for selection of training data and test data from limited data for use in training and testing machine learning models. Various methodologies are described herein including but not limited to selection of data sets wherein test data a subset of a first plurality of data items and the training data comprises the remainder of the first plurality of data items, wherein data items are allocated as test data for only one of the plural...