US Patent Issued on Nov. 25 for "Mechanism for remotely controlling the contacting of wafer probes attached to load pull tuners" (Canadian Inventor)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,986, issued on Nov. 25.

"Mechanism for remotely controlling the contacting of wafer probes attached to load pull tuners" was invented by Christos Tsironis (Kirkland, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "An on-wafer load pull tuner system includes an intelligent, universal, remotely controlled, mechanical wafer-probe contact controlling device, supporting automatic microwave single or multi-probe balanced slide screw tuners. It allows contacting and stable on-wafer testing of sub-micrometric devices. Ultra-low loss rigid airlines (bend-lines) used to connect the tuner with the semiconductor chips, in order to improve the tuning range...