US Patent Issued on May 12 for "Integrated universal serial bus data cable testing device and testing method" (Chinese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,198, issued on May 12.

"Integrated universal serial bus data cable testing device and testing method" was invented by Yanjun Lyu (Dongguan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated USB data cable testing device includes: a multi-port testing board, integrating at least seven types of USB ports and a Lightning port; a main controller module, including: a main control MCU configured to perform continuity detecting, protocol parsing, and resistance calculation, and a protocol parsing chip connected to the main control MCU via an I2C bus; an integrated detection module, including a continuity detecting circuit, an internal resis...