ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,989, issued on March 31.
"Test pin structure" was invented by Cheong Kheng Ooi (Penang, Malaysia).
According to the abstract* released by the U.S. Patent & Trademark Office: "This invention discloses a test pin structure comprising a main body end, with a first elastic pin and a second elastic pin extending from the main body end on the same side, wherein the first elastic pin extends obliquely upward from one end of the main body end; the other end of the first elastic pin is connected to a counteracting pin portion; and a needle tip is vertically positioned at the other end of the counteracting pin portion; a pin is vertically oriented downward at the other end of the second e...