US Patent Issued on March 31 for "Opto-electrical probe card platform for wafer-level testing of optical mems structures" (Egyptian Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,991, issued on March 31.

"Opto-electrical probe card platform for wafer-level testing of optical mems structures" was invented by Tarek Mohamed Zeinah (Cairo), Bassem Mortada (Cairo), Momen Anwar (Cairo), Mohamed Ramadan (El Gharbia, Egypt), Mohamed Hamouda (Cairo), Yasser M. Sabry (Cairo), Diaa Khalil (Cairo), Ahmed Shebl (Cairo), Bassam Saadany (Cairo), Ahmed Emad (Qalyubia, Egypt), Mohamed Elsayed (Obour City, Egypt) and Moez ElMassry (Giza, Egypt).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the disclosure relate to an apparatus including an opto-electrical probe card platform for wafer-level testing of optical micro-electro-mechani...