US Patent Issued on July 7 for "Non-contact electroluminescence defect detection method" (Chinese Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,577, issued on July 7.

"Non-contact electroluminescence defect detection method" was invented by Zijing Xu (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A non-contact electroluminescence defect detection method, including: acquiring a center photoluminescence image, left and right electroluminescence images of a moving solar cell. Performing a fusion processing on the images to identify overlapping boundary regions, and determining a boundary distortion, and then locating initial defect position coordinates. Measuring left and right diffusion distances using images to generate a diffusion asymmetry degree, and determining a defect shi...