US Patent Issued on July 14 for "Method and system for testing high-voltage ride-through of photovoltaic inverter" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,048, issued on July 14.

"Method and system for testing high-voltage ride-through of photovoltaic inverter" was invented by Chenhui Niu (Nanjing, China), Qingwei Cao (Nanjing, China), Zhongyuan Yao (Nanjing, China), Fang Bian (Nanjing, China), Xiaolu Chen (Nanjing, China) and Yu Zhang (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a method and system for testing high-voltage ride-through of a photovoltaic inverter. The method for testing high-voltage ride-through of a photovoltaic inverter includes: connecting a board-to-board (BTB) circuit to a passive circuit in series, and connecting circuit breakers to the passive ci...