ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,551,930, issued on Feb. 17.
"Method and device for sorting silicon fragments" was invented by Franz Bergmann (Munich) and Thomas Schrock (Munich).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and devices for sorting silicon fragments. The method includes the steps of singulating the chunks in a singulating region and recording the projected area of a chunk in a 2D profile plane with at least one first measuring device. Recording at least one height information item above and/or below the 2D profile plane with at least one further measuring device. Calculating the size of the chunk from the projected area and the height information item and contr...