ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,217, issued on Dec. 16.
"Thickness measuring system and method" was invented by Michael Jenkins (Naperville, Ill.) and Peter Neumann (Chicago).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method monitoring a wall condition within industrial equipment. The system includes at least one sensor device coupled to a non-wear side of the wall. The non-wear side of the wall is configured to be mounted to a substrate of the industrial equipment while the at least one sensor device is coupled to the non-wear side of the wall. The wall is configured to protect at least a portion of the substrate from wear from work material moving within the indu...