ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,524, issued on Aug. 11.
"Method and apparatus for testing a semiconductor device" was invented by ZunBae Moon (Gyeonggi-do, South Korea), WonJung Kim (Incheon, South Korea) and KyouYong Han (Incheon, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method and an apparatus for testing a semiconductor device are provided. The apparatus includes: one or more ground contacts configured for coupling to one or more ground terminals of the semiconductor device respectively; and a detection module having one or more inputs coupled to the one or more ground contacts respectively, and configured to detect electrical conditions at the one or more g...