US Patent Issued on Aug. 11 for "Dual patch system for measuring tissue properties" (Texas Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,702,859, issued on Aug. 11.

"Dual patch system for measuring tissue properties" was invented by John Hanks (Austin, Texas) and Amir Zavareh (College Station, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein are medical patches and dual patch systems for real-time post-operative monitoring of tissue properties and flap monitoring. The medical patch may be a flap patch that has modules to measure tissue oxygenation and skin temperature and to deliver a therapy to the tissue and to control the flap patch or may be a reference patch configured to also measure ambient temperature. Both the flap patch and the reference patch additionally m...