INTERNATIONAL PATENT: YIELD ENGINEERING SYSTEMS, INC. FILES APPLICATION FOR "HIGH TEMPERATURE ANNEALING OF SEMICONDUCTOR SUBSTRATES"

GENEVA, March 31 -- YIELD ENGINEERING SYSTEMS, INC. (3178 Laurelview CourtFremont, California 94538) filed a patent application (PCT/US2025/046601) for "HIGH TEMPERATURE ANNEALING OF SEMICONDUCTOR SUBSTRATES" on Sep 16, 2025. With publication no. WO/2026/064312, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LANE, Christopher (3178 Laurelview CourtFremont, California 94538), LAAKSONEN, Tapani (3178 Laurelview CourtFremont, California 94538), STONE, Alan Lee (3178 Laurelview CourtFremont, California 94538), KUDRIAVTSEV, V...