INTERNATIONAL PATENT: YALE UNIVERSITY FILES APPLICATION FOR "SYSTEMS AND METHODS FOR COLOR SCANNING ELECTRON MICROSCOPY (SEM)"

GENEVA, May 12 -- YALE UNIVERSITY (Two Whitney AvenueNew Haven, CT 06510) filed a patent application (PCT/US2025/052836) for "SYSTEMS AND METHODS FOR COLOR SCANNING ELECTRON MICROSCOPY (SEM)" on Oct 28, 2025. With publication no. WO/2026/096458, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): XU, C., Shan (1165 Racebrook Rd.Woodbridge, CT 06525), PANG, Song (1165 Racebrook Rd.Woodbridge, CT 06525), DEWITT, Martin, Gabriel (1 Front St.New Haven, CT 06513)

Abstract: A scanning electron microscopy (SEM) system performs colo...