INTERNATIONAL PATENT: XCERRA CORPORATION FILES APPLICATION FOR "METHOD AND APPARATUS FOR MONITORING OVERCURRENT CONDITIONS IN SWITCHES FOR SEMICONDUCTOR DEVICE TESTING"

GENEVA, April 8 -- XCERRA CORPORATION (825 University AvenueNorwood, Massachusetts 02062) filed a patent application (PCT/US2025/047562) for "METHOD AND APPARATUS FOR MONITORING OVERCURRENT CONDITIONS IN SWITCHES FOR SEMICONDUCTOR DEVICE TESTING" on Sep 23, 2025. With publication no. WO/2026/072576, the details related to the patent application was published on Apr 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BOYD, Stefen (c/o Xcerra Corporation825 University AvenueNorwood, Massachusetts 02062)

Abstract: An overcurrent monitoring method which can be implemented by computer program in...