International Patent: X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

GENEVA, July 1 -- HORIBA, LTD. filed a patent application (JP2025/042847) for “X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM”. With publication no. WO/2026/126997, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 23/223

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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