International Patent: VISION-BASED METROLOGY SYSTEM AND CHARACTERIZING THERMAL ERRORS WITHIN A MACHINE TOOL

GENEVA, Sept. 18 -- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE filed a patent application (US2025/057591) for “VISION-BASED METROLOGY SYSTEM AND CHARACTERIZING THERMAL ERRORS WITHIN A MACHINE TOOL”. With publication no. WO/2026/187422, here are the other details related to the patent application:

Kind: Initial Publication without ISR [A2]

IPC: G01B 9/04

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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