INTERNATIONAL PATENT: UNITY SEMICONDUCTOR FILES APPLICATION FOR "DEFLECTOMETRY INSPECTION DEVICE FOR SEMICONDUCTOR SUBSTRATES"

GENEVA, March 30 -- UNITY SEMICONDUCTOR (611 rue Aristide Berges38330 MONTBONNOT-SAINT-MARTIN) filed a patent application (PCT/EP2025/076110) for "DEFLECTOMETRY INSPECTION DEVICE FOR SEMICONDUCTOR SUBSTRATES" on Sep 12, 2025. With publication no. WO/2026/061908, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ISNARD, Christophe (5F., No.148, Tongan St, Da'an DistrictTAIPEI City), VIAL, Jean-Jacques (7 rue de Docteur Bordier38100 GRENOBLE), BERGOËND, Isabelle (Cite Jardin, 13 Allee de la Raperie38420 DOMENE)

Abstract...