INTERNATIONAL PATENT: UNITY SEMICONDUCTOR FILES APPLICATION FOR "A SYSTEM FOR INSPECTING A PERIPHERAL EDGE OF A SUBSTRATE"

GENEVA, Sept. 1 -- UNITY SEMICONDUCTOR (611 rue Aristide Berges38330 MONTBONNOT-SAINT-MARTIN) filed a patent application (PCT/EP2025/053107) for "A SYSTEM FOR INSPECTING A PERIPHERAL EDGE OF A SUBSTRATE" on Feb 06, 2025. With publication no. WO/2025/176475, the details related to the patent application was published on Aug 28, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FORGE, Sebastien (72 Chemin du Monnet38430 ST JEAN DE MOIRANS)

Abstract: The invention concerns a system (OS) for inspecting a peripheral edge of a substrate (1) by projecting an inspection light wave on a portion of t...