International Patent: UE-INITIATED/EVENT-DRIVEN BEAM MEASUREMENT AND REPORTING PROCEDURES

GENEVA, July 18 -- SAMSUNG ELECTRONICS CO., LTD. filed a patent application (KR2026/000464) for “UE-INITIATED/EVENT-DRIVEN BEAM MEASUREMENT AND REPORTING PROCEDURES”. With publication no. WO/2026/151261, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: H04B 7/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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