GENEVA, Sept. 9 -- TOKYO SEIMITSU CO., LTD. (2968-2, Ishikawa-machi, Hachioji-city, Tokyo1928515), 株式会社東京精密 (東京都八王子市石川町２９６８－２) filed a patent application (PCT/JP2025/004551) for "PROBER AND PROBE INSPECTION METHOD" on Feb 12, 2025. With publication no. WO/2025/182563, the details related to the patent application was published on Sep 04, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): FUKANO Eiji (c/o Tokyo Seimitsu Co., Ltd.,...