INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, TOKYO ELECTRON U.S. HOLDINGS, INC. FILES APPLICATION FOR "OPTICAL METROLOGY"

GENEVA, June 4 -- TOKYO ELECTRON LIMITED (3-1 Akasaka 5-chome, Minato-kuTokyo, 107-6325), TOKYO ELECTRON U.S. HOLDINGS, INC. (2400 Grove BoulevardAustin, Texas 78741) filed a patent application (PCT/US2024/047545) for "OPTICAL METROLOGY" on Sep 19, 2024. With publication no. WO/2025/111054, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TUITJE, Holger (2859 Bayview Dr.Fremont, California 94538), TIAN, Xinkang (2859 Bayview Dr.Fremont, California 94538), MENG, Ching Ling (2859 Bayview Dr.Fremont, California 94538)

Abstra...