INTERNATIONAL PATENT: THE UNIVERSITY OF TOKYO, 国立大学法人 東京大学 FILES APPLICATION FOR "DISPLACEMENT MEASURING APPARATUS, DISPLACEMENT MEASURING METHOD AND SCALE-PITCH MEASURING DEVICE"

GENEVA, Sept. 9 -- THE UNIVERSITY OF TOKYO (3-1, Hongo 7-chome, Bunkyo-ku, Tokyo1138654), 国立大学法人　東京大学 (東京都文京区本郷七丁目３番１号) filed a patent application (PCT/JP2025/006330) for "DISPLACEMENT MEASURING APPARATUS, DISPLACEMENT MEASURING METHOD, AND SCALE-PITCH MEASURING DEVICE" on Feb 25, 2025. With publication no. WO/2025/182892, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organiz...