INTERNATIONAL PATENT: THE HONG KONG POLYTECHNIC UNIVERSITY, 香港理工大学 FILES APPLICATION FOR "MEASUREMENT SYSTEM, METHOD AND APPARATUS, DEVICE, MEDIUM AND PRODUCT"

GENEVA, April 27 -- THE HONG KONG POLYTECHNIC UNIVERSITY (11 Yuk Choi Rd, Hung Hom KowloonHong Kong 999077), 香港理工大学 (中国香港特别行政区九龙红磡育才道11号) filed a patent application (PCT/CN2025/101003) for "MEASUREMENT SYSTEM, METHOD, AND APPARATUS, DEVICE, MEDIUM, AND PRODUCT" on Jun 13, 2025. With publication no. WO/2026/081509, the details related to the patent application was published on Apr 23, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CH...